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ScopeX Family (Benchtop )

XRF analyzer for Quartz

    XRF analyzer for Quartz

    Natural silica (SiO₂) is mainly derived from minerals and rocks, such as quartz, feldspar, granite, diatomaceous earth, etc. Among them, quartz, as pure silica crystal, is one of the main sources of industrial silica extraction. However, there are many types of impurity elements in quartz raw materials, and the impurity content is high and the occurrence states are diverse.

    The conditions for forming quartz ore vary from region to region, and the presence of impurities in raw materials also varies. To select the correct high-purity quartz raw material and formulate the best quartz purification plan, it is necessary to clarify the silica content and the occurrence status of impurity elements in the quartz.

    LANScientific's XRF analyzer is specially designed for the analysis of quartz raw material components. It combines spectral analysis technology and vacuum system. It has the advantages of simple sample preparation, wide linear range, fast analysis speed, good reproducibility, and high precision. It can also accurately detect the content of silica and impurity elements, making it an ideal tool for quartz raw material analysis.

    Advantage

    High performance configuration

    Low energy X-ray with intelligent vacuum system, Si, P, S, Al, Mg and other light elements have a good excitation effect, XRF technology can be used to analyze the high content of Cr, Ni, Mo and other key elements.

    After-sales service

    The 7*24-hour customer service hotline quickly responds to customer needs, provides fast and professional customer service, ensures customers a worry-free experience, and continuously optimizes products and services.

    Custom

    Files can be exported in EXCEL, PDF and other formats. Users can create customized test reports: including company logo, spectral diagrams and other sample information.

    User interface

    The instrument is equipped with an easy-to-operate user interface, allowing operators to easily perform test even without a strong professional background.

    Peltier refrigeration

    The advanced Peltier electric refrigeration method eliminates the need for liquid nitrogen, reduces the complexity of equipment use, and saves manpower and equipment maintenance costs.

    Fully automatic vacuum system

    The fully automatic vacuum system shields the influence of air on light elements, improves the detection limit, and expands the detection range..


    Application scenario

    XRF analyzer for Quartz(图1)

    Quartz composition analysis

    It can non-destructively analyze major and trace elements in quartz samples, such as SiO₂, Fe, Al, Ca, Mg, Ti, etc., to help determine the purity and impurity content of quartz.


    XRF analyzer for Quartz(图2)

    Quartz quality distinction

    It can be used to distinguish different qualities of quartz, such as quartz sand for photovoltaics, quartz for plates, etc.

    XRF analyzer for Quartz(图3)

    Mineral deposit exploration

    The instrument is used to quickly analyze quartz ore samples, helping geologists assess the industrial value of the deposit and the mining potential of quartz.

    XRF analyzer for Quartz(图4)

    Production process control

    During quartz mining and processing, it can be used to monitor product quality and ensure that the quartz material meets the requirements of a specific application.


    XRF analyzer for Quartz(图5)

    Research and education

    The instrument is used in the research and teaching of quartz mineralogy to help scientists and students better understand the properties and classification of quartz.



    Product Parameters

    Test object Coal ash, coking coal, raw coal, etc.
    Range of element Na—U
    Sample room size 304mm×368mm×78mm(L×W×H)
    Sample weight range 0-2.5KG
    Cover open Automatic
    Mainframe size 570mm×400mm×400mm(L×W×H)
    Mainframe weight 64KG
    Target W Target
    Filter Special filters can reduce the interference caused by X-ray fluorescence signals of other elements to the analysis target elements, thereby improving the signal-to-noise ratio.
    Test Window The ring-shaped sample test holder made of pom material is conducive to the effective penetration of X-rays into the sample while minimizing the absorption and scattering of X-rays, thereby improving the detection limit and analysis accuracy.
    X-ray tube High power side window X-ray tube
    Voltage Up to 50kV
    Current Maximum 1mA
    Cooling method Air cooling
    Detector SDD
    Sampling method Hand sampling、Autoinjection
    Sample observation 5 megapixel HD industrial camera
    PC(CPU) CPU is I3-7100 with the same main frequency or above
    RAM DDR4 4 GB memory or above
    ROM 1TB HDD or 256GB SSD or above
    OS Windows 11
    Temperature conditions 10°C~35°C
    Relative humidity 40%-70% (No condensation)
    Power supply 220VAC
    Rated power 600W



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